Authors: Pamela Viale, Claudia Frydman, Jacques Pinaton
This paper presents an approach to construct models for very large sequential processes with duplicated activities. Very large meaning processes containing hundreds of activ- ities. The algorithm uses traces of the process we are in- terested in modeling and construct an alignment between them. The alignment obtained is then used to guide the model construction. We present also the application of our approach to STMicroelectronics? manufacturing processes. The constant modifications of semiconductor specifications forces engineers to continuously update processes. For this reason, STMicroelectronics is interested in re-constructing models of its manufacturing processes to being able to con- trol their definitions and quickly react in case a problem is detected.